N101-027 TITLE: Universal Switching Across Automatic Test Systems

TECHNOLOGY AREAS: Information Systems

ACQUISITION PROGRAM: PMA-260, Aviation Support Equipment Program Office

RESTRICTION ON PERFORMANCE BY FOREIGN CITIZENS (i.e., those holding non-U.S. Passports): This topic is "ITAR Restricted." The information and materials provided pursuant to or resulting from this topic are restricted under the International Traffic in Arms Regulations (ITAR), 22 CFR Parts 120 - 130, which control the export of defense-related material and services, including the export of sensitive technical data. Foreign Citizens may perform work under an award resulting from this topic only if they hold the "Permanent Resident Card", or are designated as "Protected Individuals" as defined by 8 U.S.C. 1324b(a)(3). If a proposal for this topic contains participation by a foreign citizen who is not in one of the above two categories, the proposal will be rejected.

OBJECTIVE: Develop a universal switching strategy that will unify signal routing information for differing Automatic Test System (ATS) architectures into abstractions that provide a common understanding of function and purpose.

DESCRIPTION: A key element of various test systems is switching management. Many systems employ various forms of switching that must be allocated. The switching architectures and implementations are widely various in format and capability. Electronic architectures that are facilitated with multiple path connection possibilities often could be designed in a more flexible and fault tolerant way if a well based model, and deployment scheme for the model, are widely accepted. Often there are cases where developers use prior knowledge of the system’s specific locations to design switching networks. To enhance designs, inject more flexibility, and achieve more error tolerance, a technology with the ability to actively route, allocate and generally abstract the switching designs from hard wire instantiations is needed. DoD testers could benefit from incorporating standardized switching strategies and technologies. Incorporation of these prospective technologies would enhance TPS interoperability between systems of varying architectures, thereby promoting life cycle cost reduction.

Two elements in the DoD’s ATS Framework, which have not yet been completed are Resource Management Services (RMS) and Resource Adapter Information (RAI). A predominant feature that these elements must support is a method to facilitate universal switching. Currently there is no abstraction for switching implementation in the industry or the standards community. Satisfactorily providing the DoD ATS Framework with components and standards that can support this needed key area will promote the strategy and provide cost savings in future systems that employ it.

PHASE I: Demonstrate the feasibility of proposed universal switching concepts that will work across Navy and DoD automated test systems.

PHASE II: Based on Phase I modeling, develop a prototype and performance criteria for evaluation. Demonstrate and validate the concept by developing a complete prototype that is integrated on an existing system. Analyze and detail the technical merit of the prototype based on the DoD ATS Framework elements and the DoD system identified.

PHASE III: Provide a mechanism for incorporating the universal switching technologies into a broad range of potential electronic systems.

PRIVATE SECTOR COMMERCIAL POTENTIAL/DUAL-USE APPLICATIONS: All commercial industries that utilize ATS will benefit from this technology, in particular, airlines, automotive, and medical.

REFERENCES:
1. Rowe, Martin. "Avoid Switching Mistake". Test & Measurement Magazine, September 2007. http://www.tmworld.com/article/CA6473099.html.

2. Wag, Francis C. "A Guide to DFT and Other Techniques". IEEE, Published by Academic Press, 1991, ISBN 0127345809, 9780127345802

3. The DoD Automatic Test System Framework Roadmap; http://www.acq.osd.mil/ats/

KEYWORDS: Switch; Resource Management; Architecture; Interoperability; Ontology; Automatic Test System

** TOPIC AUTHOR (TPOC) **

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