Metrology for Ogive Infrared Dome Navy SBIR FY2006.1 Sol No.: Navy SBIR FY2006.1 Topic No.: N06-069 Topic Title: Metrology for Ogive Infrared Dome Proposal No.: N061-069-0817 Firm: VI Manufacturing, Inc. dba OptiPro Systems 6368 Dean Parkway Ontario, New York 14519 Contact: Michael Bechtold Phone: (585) 265-0160 Web Site: www.OptiPro.com Abstract: OptiPro Systems manufactures computer controlled grinding and polishing machines for the production of precision optics. We are developing machines for manufacturing of conformal, aspherical and ogive shaped optical elements. Our newly developed UltraForm finishing process has become a critical piece in the solution for grinding and polishing these nearly impossible shapes. The UltraForm Process is being tested with very difficult materials such as AlON, Spinel, and Polycrystalline Alumina, which will be the materials of choice for the next generation missile domes. With OptiPro's understanding of the deep ogive shape, and the need for a metrology system to measure these parts, we conceived a solution that will, by minimizing the axes of motion, using state of the art motion control products, and integrating a high accuracy non-contact probe, allowing us to precisely scan the concave and convex surfaces of the ogive dome. The UltraForm "SurfScan" metrology system will use computer controlled "raster style" surface scanning, techniques, to create a complete topographical surface map of the surface form and roughness measurements. A robust graphical user interface will be developed along with the surface analysis software and algorithms to insure both ease of use, and capability to meet the specific requirements. Benefits: As the process for manufaturing difficult aspheres and ogive shape domes continues, we see a real potential for the in-process and final testing of these components which will be a required piece of equipment for any manufacturing firm producing these types of components. Our efforts with NASA Goddard Space Center have shown that this research could also be useful for their current and future metrology requirements. Return