Automated Generation of Advanced Test Diagrams to Reduce Test Program Set Life-Cycle Costs Navy SBIR FY2010.1 Sol No.: Navy SBIR FY2010.1 Topic No.: N101-029 Topic Title: Automated Generation of Advanced Test Diagrams to Reduce Test Program Set Life-Cycle Costs Proposal No.: N101-029-0915 Firm: Diamond Glen Software 4316 Marina City Dr Unit 831 Marina del Rey, California 90292-5819 Contact: Geoffrey Ingram Phone: (310) 821-2395 Web Site: www.diamondglen.com Abstract: The three Key Personnel dedicated to the investigation/analysis for this SBIR N101-029 proposal have already designed and developed a working automatic Test Diagram Generator, which we called TDGen. TDGen generated thousands of Test Diagrams for fifteen C130 METS TPSs. The new version of TDGen as a result of this feasibility study will be named the Dynamic Test Diagram Generator (D-TDGen). This proposal will describe the process by which Diamond Glen Software will investigate the feasibility of using ATML as the input to D-TDGen and the inclusion of stimulus and measurement signal parameters in the D-TDGen Test Diagrams. Our previous experience in developing the C130 METS TDGEN product results in minimal risk and a high probability of success in the design and development of the new and improved Dynamic Test Diagram Generator (D-TDGen). Benefits: The market potential of D-TDGen for commercial applications will apply to any commercial industry that can benefit from detailed System Interconnect Diagrams (SIDs) for systems containing multiple subassemblies. D-TDGen will reduce costs associated with the development of (SIDs), improve the accuracy of the SIDs, save engineering hours and reduce costs associated with systems design/development, integration/debug, maintenance and troubleshooting and simplification of any systems analysis efforts associated with design changes. Since D-TDGen will generate System Interconnect Diagrams of signal current flow through connector/wire paths including passive and active circuit components (including FPGA's and CPLD's) and relays, the potential for automatically generating complex system interconnect diagrams is practically unlimited. Potential commercial applications include: * Commercial aircraft avionics test applications * Any commercial electronics test application such as manufacturing test, Environmental Qualification Testing, Design Verification Testing (DVT) * Commercial Industrial control systems * Automotive industry * Medical Electronics industry * Entertainment electronics systems * Ground Based flight control systems * Electro-Mechanical based Trainer systems * Computer based data systems * Communication systems Return